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Patent 7485908 Click For Printable Version of This Patent
Patent Information:  USPTO Site Listing

Patent Number: 7485908
Case ID: 0
Patent Title: Insulated gate silicon nanowire transistor and method of manufacture
Status: ACTIVE
Status Date: 2/3/2010 1:52:18 PM
Issue Date: 2/3/2009
Filed Date: 8/18/2005
Serial #: 1/208,127
Assignee Name: United States of America as represented by the Secretary of the Air Force (Washington, DC)
Inventor(s): Anwar, Abul F , Webster, Richard T.
Lab Information:  View Lab Profile

Lab Name: Sensors Directorate
Location: 2241 Avionics Circle, Building 620
Wright-Patterson AFB, OH 45433
Contact: Contact Lab About This Patent
   
Description:
FIELD OF THE INVENTION

The present invention relates generally to transistor structures and, more particularly, to an insulated gate silicon nanowire transistor structure.

BACKGROUND OF THE INVENTION

As is known, free-standing nanostructures are currently being extensively explored. These nanostructures are especially attractive for sensor applications because their high surface-to-volume ratio makes them very sensitive to charged species adsorbed on their surfaces. Lateral growth of carbon nanotubes between two electrodes during chemical vapour deposition (CVD) has been realized for which a lateral electric field applied between the electrodes attracts the growing nanotube towards the counter-electrode. Although the potential of carbon nanotubes for applications such as gas-sensing field-effect devices has been demonstrated, the difficulty of synthesizing only metallic or only semiconducting nanotubes and the difficulty of modifying nanotube surfaces have li . . . . More
Abstract:
An insulated gate silicon nanowire transistor amplifier structure is provided and includes a substrate formed of dielectric material. A patterned silicon material may be disposed on the substrate and includes at least first, second and third electrodes uniformly spaced on the substrate by first and second trenches. A first nanowire formed in the first trench operates to electrically couple the first and second electrodes. A second nanowire formed in the second trench operates to electrically couple the second and third electrodes. First drain and first source contacts may be respectively disposed on the first and second electrodes and a first gate contact may be disposed to be capacitively coupled to the first nanowire. Similarly, second drain and second source contacts may be respectively disposed on the second and third electrodes and a second gate contact may be disposed to be capacitively coupled to the second nanowir . . . . More
Claims:
What is claimed is:

1. An insulated gate silicon nanowire transistor amplifier structure, comprising: a substrate formed of dielectric material; a patterned silicon material disposed on the substrate and including at least first, second and third electrodes uniformly spaced on the substrate by first and second trenches; at least a first nanowire formed in the first trench and being operative to electrically couple the first and second electrodes; at least a second nanowire formed in the second trench and being operative to electrically couple the second and third electrodes; first drain and first source contacts respectively disposed on the first and second electrodes and first gate contact being capacitively coupled to the first nanowire; second drain and second source contacts respectively disposed on the second and third electrodes and second gate contact being capacitively coupled to the second nanowire; wherein the first drain contact is coupled to receive current f . . . . More